AM93LC86TS datasheet(3/12 Pages) ANACHIP

部件名	AM93LC86TS

功能描述	16384-bits Serial Electrically Erasable PROM

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制造商	ANACHIP [Anachip Corp]

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AM93LC86

16384-bits Serial Electrically Erasable PROM

(Preliminary)

Anachip Corp.

www.anachip.com.tw

Rev 0.1 Oct 20, 2003

3/12

DC Electrical Characteristics (Vcc =2.7~5.5V, T

A = 25

oC, unless otherwise noted)

Symbol

Parameter

Conditions

Min

Max

Unit

I

CC

Operating current**

CS=VIH, SK=1MHz CMOS input levels

3

mA

I

SB

Standby current

CS=DI=SK=0V

10

µA

I

IL

Input leakage

VIN = 0V to VCC(CS,SK,DI)

-1

1

µA

I

OL

Output leakage

VOUT = 0V to VCC, CS=0V

-1

1

µA

VCC = 3V + 10%

-0.1

0.15 VCC

V

IL

Input low voltage**

VCC = 5V + 10%

-0.1

0.8

V

VCC = 3V + 10%

0.8 VCC

VCC +0.2

V

IH

Input high voltage**

VCC = 5V + 10%

2

VCC+0.2

V

OL1

Output low voltage

IOL = 2.1mA TTL, VCC=5V + 10%

0.4

V

OH1

Output high voltage

IOH = -400uA TTL, VCC=5V + 10%

2.4

V

OL2

Output low voltage

IOL = 10uA CMOS

0.2

V

OL2

Output high voltage

IOH = -10uA CMOS

VCC -0.2

V

Note ** : ICC, VIL min and VIH max are for reference only and are not tested.

AC Electrical Characteristics (Vcc = 2.7V ~ 5.5V, T

A = 25

oC, unless otherwise noted)

Symbol

Parameter

Conditions

Min

Max

Unit

FSK

SK Clock Frequency

0

1

Mhz

TSKH

SK High Time

250

nS

TSKL

SK Low Time

250

nS

TCS

Minimum CS Low Time

250

nS

TCSS

CS Setup Time

Relative to SK

50

nS

TDIS

DI Setup Time

Relative to SK

100

nS

TCSH

CS Hold Time

Relative to SK

0

nS

TDIH

DI Hold Time

Relative to SK

100

nS

TPD1

Output Delay to "1"

AC test (Fig. 1)

500

nS

TPD0

Output Delay to "0"

AC test (Fig. 1)

500

nS

TSV

CS to Status Valid

AC test CL = 100pF

500

nS

TDF

CS to DO in 3-state

CS = VIL

100

nS

TWP

Write Cycle Time

10

mS

Endurance(note)

5V, 25ºC

1M

write cycles

Note: The parameter is characterized and isn’t 100% tested.

632 ohm

DO

1.247V

(1 TTL Gate Load)

100PF

Figure 1. AC test circuit

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