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AD5425YRM-REEL7 数据表(PDF) 10 Page - Analog Devices |
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AD5425YRM-REEL7 数据表(HTML) 10 Page - Analog Devices |
10 / 20 page REV. 0 –10– AD5425 TERMINOLOGY Relative Accuracy Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the end- points of the DAC transfer function. It is measured after adjusting for zero and full scale and is normally expressed in LSBs or as a percentage of full-scale reading. Differential Nonlinearity Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of –1 LSB max over the operating temperature range ensures monotonicity. Gain Error Gain error or full-scale error is a measure of the output error between an ideal DAC and the actual device output. For these DACs, ideal maximum output is VREF – 1 LSB. Gain error of the DACs is adjustable to 0 with external resistance. Output Leakage Current Output leakage current is current that flows in the DAC ladder switches when these are turned off. For the IOUT1 terminal, it can be measured by loading all 0s to the DAC and measuring the IOUT1 current. Minimum current will flow in the IOUT2 line when the DAC is loaded with all 1s. Output Capacitance Capacitance from IOUT1 or IOUT2 to AGND. Output Current Settling Time This is the amount of time it takes for the output to settle to a specified level for a full-scale input change. For these devices, it is specified with a 100 Ω resistor to ground. The settling time specification includes the digital delay from SYNC rising edge of the full scale output charge. Digital-to-Analog Glitch lmpulse The amount of charge injected from the digital inputs to the analog output when the inputs change state. This is normally specified as the area of the glitch in either pA-secs or nV-secs depending upon whether the glitch is measured as a current or voltage signal. Digital Feedthrough When the device is not selected, high frequency logic activity on the device digital inputs is capacitively coupled through the device to show up as noise on the IOUT pins and subsequently into the following circuitry. This noise is digital feedthrough. Multiplying Feedthrough Error This is the error due to capacitive feedthrough from the DAC reference input to the DAC IOUT1 terminal, when all 0s are loaded to the DAC. Total Harmonic Distortion (THD) The DAC is driven by an ac reference. The ratio of the rms sum of the harmonics of the DAC output to the fundamental value is the THD. Usually only the lower order harmonices are included, such as second to fifth. Spurious-Free Dynamic Range (SFDR) It is the usable dynamic range of a DAC before spurious noise interferes or distorts the fundamental signal. SFDR is the measure of difference in amplitude between the fundamental and the largest harmonically or nonharmonically related spur from dc to full Nyquist bandwidth (half the DAC sampling rate, or fs/2). Narrow band SFDR is a measure of SFDR over an arbitrary window size, in this case 50% of the fundamental. Digital SFDR is a measure of the usable dynamic range of the DAC when the signal is digitally generated sine wave. THD VVV V V = ++ + () 20 2 2 3 2 4 2 5 2 1 log |
类似零件编号 - AD5425YRM-REEL7 |
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类似说明 - AD5425YRM-REEL7 |
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